“It’s a bug hunt”… A look at modern trace and debugging techniques such as static and dynamic analysis.

SAN JOSE–NPTest Inc., formerly known as Schlumberger Semiconductor Solutions, here today introduced an IC failure analysis and debug tool that measures and validates flip-chip devices and other ...

SpringSoft's VIA Platform enables seamless interoperability between Verdi Automated Debug and Vennsa's OnPoint Root Cause Analysis that slashes chip d ...

Developed in a joint effort with NVIDIA, Cadence’s Dynamic Power Analysis (DPA) tool will assist engineers in creating more ...

The research, published earlier today, explores the significance of code manipulation in malware analysis, emphasizing its pivotal role for researchers, analysts and reverse engineers. Traditionally, ...